• Electromechanics of Domain Walls in Uniaxial Ferroelectrics 

      Lu, Haidong; Tan, Yueze; Richarz, Leonie; He, Jiali; Wang, Bo; Meier, Dennis; Chen, Long-Qing; Gruverman, Alexei (Peer reviewed; Journal article, 2023)
      Piezoresponse force microscopy (PFM) is used for investigation of the electromechanical behavior of the head-to-head (H-H) and tail-to-tail (T-T) domain walls on the non-polar surfaces of three uniaxial ferroelectric ...
    • Moiré fringes in conductive atomic force microscopy 

      Richarz, Leonie; He, J.; Ludacka, Ursula; Bourret, E.; Yan, Z.; Van Helvoort, Antonius; Meier, Dennis (Journal article; Peer reviewed, 2023)
      Moiré physics plays an important role in characterization of functional materials and engineering of physical properties in general, ranging from strain-driven transport phenomena to superconductivity. Here, we report on ...